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Microbeam analysis—Transmission electron microscopy—Method for measuring the thickness of functional thin films in integrated circuit chips
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STANDARD published on 15.3.2024
Designation standards: GB/T 43748-2024
Publication date standards: 15.3.2024
SKU: NS-1174218
Country: Chinese technical standard
Category: Technical standards GB
Latest update: 2026-05-21 (Number of items: 2 279 758)
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