We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Semiconductor devices—Stress migration test—Part 1: Copper stress migration test
Translate name
STANDARD published on 30.5.2025
Designation standards: GB/T 45721.1-2025
Publication date standards: 30.5.2025
SKU: NS-1223632
Country: Chinese technical standard
Category: Technical standards GB
Latest update: 2026-06-21 (Number of items: 2 283 476)
© Copyright 2026 NORMSERVIS s.r.o.