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Surface chemical analysis—Depth profiling—Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
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STANDARD published on 28.1.2026
Designation standards: GB/T 47073-2026
Note: Execute Date: august 2026
Publication date standards: 28.1.2026
SKU: NS-1264301
Country: Chinese technical standard
Category: Technical standards GB
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Latest update: 2026-07-06 (Number of items: 2 286 164)
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