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Semiconductor devices—Mechanical and climatic test methods—Part 32:Flammability of platic-encapsulated devicesexternally induced
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STANDARD published on 23.5.2023
Designation standards: GB/T 4937.32-2023
Publication date standards: 23.5.2023
SKU: NS-1145784
Country: Chinese technical standard
Category: Technical standards GB
Latest update: 2026-07-12 (Number of items: 2 286 472)
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