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Semiconductor devices—Mechanical and climatic test methods—Part 38: Soft error test method for semiconductor devices with memory
Translate name
STANDARD published on 2.12.2025
Designation standards: GB/T 4937.38-2025
Publication date standards: 2.12.2025
SKU: NS-1252190
Country: Chinese technical standard
Category: Technical standards GB
Latest update: 2026-07-12 (Number of items: 2 286 472)
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