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  4. Standard "GB/T 6617-2009"
Standard GB/T 6617-2009 30.10.2009 preview

GB/T 6617-2009

Test method for measuring resistivity of silicon wafer using spreading resistance probe

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STANDARD published on 30.10.2009


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Price226.80 USD excl. VAT
226.80 USD

The information about the standard:

Designation standards: GB/T 6617-2009
Publication date standards: 30.10.2009
SKU: NS-888241
Country: Chinese technical standard
Category: Technical standards GB

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