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Standard method for measuring the surface quality of polished silicon slices by visual inspection
Translate name
STANDARD published on 30.10.2009
Designation standards: GB/T 6624-2009
Publication date standards: 30.10.2009
SKU: NS-888251
Country: Chinese technical standard
Category: Technical standards GB
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Latest update: 2026-07-08 (Number of items: 2 286 190)
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