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Semiconductor silicon and quartz. Method of impurities determination
STANDARD published on 1.1.1986
Designation standards: GOST 26239.5-84
Publication date standards: 1.1.1986
SKU: NS-389166
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: Russian technical standard
Category: Technical standards GOST
Implemented changes and corrections:
Amd. 10.90
1.1.1986
1.1.1986
1.1.1986
1.1.1987
1.1.1987
1.1.1988
Latest update: 2026-05-01 (Number of items: 2 275 280)
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