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Standard GOST R 8.698-2010 1.9.2010 preview

GOST R 8.698-2010

State system for ensuring the uniformity of measurements. Dimensional parameters of nanoparticles and thin films. Method for measurement by means of a small angle X-ray scattering diffractometer



STANDARD published on 1.9.2010


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Price835.00 USD excl. VAT
835.00 USD

The information about the standard:

Designation standards: GOST R 8.698-2010
Publication date standards: 1.9.2010
SKU: NS-404491
The number of pages: 38
Approximate weight : 114 g (0.25 lbs)
Country: Russian technical standard
Category: Technical standards GOST

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