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IEC 60269-4-ed.5.0
Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
STANDARD published on 28.5.2009
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The information about the standard:
Designation standards: IEC 60269-4-ed.5.0
Publication date standards: 28.5.2009
SKU: NS-409345
The number of pages: 106
Approximate weight : 349 g (0.77 lbs)
Country: International technical standard
The category - similar standards:
Annotation of standard text IEC 60269-4-ed.5.0 :
IEC 60269-4:2009 is to be used in conjunction with IEC 60269-1. This Part 4 supplements or modifies the corresonding clauses or subclauses of Part 1. Fuse-links for the protection of semiconductor devices shall comply with aIl requirements of IEC 60269-1, if not otherwise indicated hereinafter, and shall also comply with the supplementary requirements laid down below. This fifth edition cancels and replaces the fourth edition published in 2006. It constitutes a technical revision. The significant technical changes to the fourth edition are: - the introduction of voltage source inverter fuse-links, including test requirements; - coverage of the tests on operating characteristics for a.c. by the breaking capacity tests; - the updating of examples of standardised fuse-links for the protection of semiconductor devices. La CEI 60269-4:2009 doit etre utilisee conjointement avec la quatrieme edition de la CEI 60269-1. Cette Partie 4 complete ou modifie les articles ou paragraphes correspondant de la Partie 1. Sauf indication contraire dans le texte qui suit, les elements de remplacement utilises pour la protection des dispositifs a semiconducteurs doivent repondre a lensemble des exigences enoncees dans la CEI 60269-1 ainsi quaux exigences supplementaires fixees ci-apres. Cette cinquieme edition annule et remplace la quatrieme edition, parue en 2006. Elle constitue une revision technique. Les modifications techniques significatives par rapport a la quatrieme edition sont: - lintroduction des elements de remplacement pour onduleur a source de tension, y compris les exigences dessai; - les essais sur les caracteristiques de fonctionnement en courant alternatif, maintenant couverts par les essais de pouvoir de coupure; - la mise a jour des exemples delements de remplacement normalises pour la protection des dispositifs a semiconducteurs.
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