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Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
STANDARD published on 7.10.2010
Designation standards: IEC 60444-11-ed.1.0
Publication date standards: 7.10.2010
SKU: NS-410247
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: International technical standard
Category: Technical standards IEC
IEC 60444-11:2010 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4. La CEI 60444-11:2010 definit la methode normalisee de mesure de la frequence de resonance a la charge fL a la valeur nominale de CL et la determination de la capacite de charge efficace CLeff a la frequence nominale pour des resonateurs de facteur de merite M > 4.
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