Standard IEC 60444-2-ed.1.0 1.1.1980 preview

IEC 60444-2-ed.1.0

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units



STANDARD published on 1.1.1980


Language
Format
AvailabilityIN STOCK
Price52.80 USD excl. VAT
52.80 USD

The information about the standard:

Designation standards: IEC 60444-2-ed.1.0
Publication date standards: 1.1.1980
SKU: NS-410248
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: International technical standard
Category: Technical standards IEC

The category - similar standards:

Piezoelectric and dielectric devices

Annotation of standard text IEC 60444-2-ed.1.0 :

Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%. Decrit une methode de mesure de la capacite dynamique des quartz dans une gamme de frequences de 1 MHz a 125 MHz avec une erreur totale de mesure de lordre de 5%.

We recommend:

Updating of laws

Do you want to be sure about the validity of used regulations?
We offer you a solution so that you could use valid and updated legislative regulations.
Would you like to get more information? Look at this page.




Cookies Cookies

We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.

You can refuse consent here.

Here you can customize your cookie settings according to your preferences.

We need your consent to use the individual data so that you can see information about your interests, among other things.