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Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors
STANDARD published on 21.1.2010
Designation standards: IEC 60747-14-1-ed.2.0
Publication date standards: 21.1.2010
SKU: NS-411277
The number of pages: 42
Approximate weight : 126 g (0.28 lbs)
Country: International technical standard
Category: Technical standards IEC
IEC 60747-14-1:2009 describes general items concerning the specifications for sensors, which are the basis for specifications given in other parts of this series for various types of sensors. Sensors described in this standard are basically made of semiconductor materials, however, the statements made in this standard are also applicable to sensors using materials other than semiconductor, for example dielectric and ferroelectric materials. The major changes with regard to the previous edition are as follows: a) Title change from "Semiconductor sensors - General and classification" to "Semiconductor sensors - Generic specification for sensors"; b) Clause 3 has been divided into three Clauses 3, 4 and 5; c) Added new terms from IEC 60747-14-5; d) Added a new Clause relating to Quality assessment procedures; e) Added a Bibliography; f) Added a new Annex for the sampling procedure. La CEI 60747-14-1:2009 decrit des points generaux concernant les specifications pour capteurs, qui sont le fondement des specifications donnees dans dautres parties de cette serie pour divers types de capteurs. Les capteurs decrits dans cette norme sont essentiellement constitues de materiaux semi-conducteurs; cependant, les indications figurant dans la presente norme sont egalement applicables aux capteurs utilisant des materiaux autres que semiconducteurs, comme par exemple, des materiaux dielectriques et ferroelectriques. Les modifications principales par rapport a ledition precedente sont les suivantes: a) Modification du titre, anterieurement "Capteurs a semiconducteurs - Generalites et classification" remplace par "Capteurs a semiconducteurs - Specification generique pour les capteurs"; b) LArticle 3 a ete divise en trois Articles 3, 4 et 5; c) Ajouts de nouveaux termes de la CEI 60747-14-5; d) Ajout dun nouvel Article relatif aux Procedures dassurance de la qualite; e) Ajout dune Bibliographie; f) Ajout dune Annexe relative a la procedure dechantillonnage.
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