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IEC 60749-13-ed.2.0
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
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STANDARD published on 15.2.2018
The information about the standard:
Designation standards: IEC 60749-13-ed.2.0
Publication date standards: 15.2.2018
SKU: NS-809229
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 60749-13-ed.2.0 :
IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. This edition includes the following significant technical changes with respect to the previous edition: a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures). L’IEC 60749-13:2018 decrit un essai d’atmosphere saline realise pour determiner la resistance a la corrosion des dispositifs a semiconducteurs. Il s’agit d’un essai accelere qui simule les effets d’une atmosphere cotiere corrosive sur toutes les surfaces exposees. Il n’est applicable qu’aux dispositifs specifies pour un environnement maritime. L’essai d’atmosphere saline est considere comme destructif. Cette edition inclut les modifications techniques majeures suivantes par rapport a ledition precedente: a) alignement avec la norme MIL-STD-883J, Method 1009.8, Salt Atmosphere (Corrosion), y compris les informations sur le conditionnement et la maintenance de la chambre d’essai et sur le montage des specimens d’essais (y compris les figures explicatives).
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