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IEC 60749-24-ed.2.0
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
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STANDARD published on 27.11.2025
The information about the standard:
Designation standards: IEC 60749-24-ed.2.0
Publication date standards: 27.11.2025
SKU: NS-1249230
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 60749-24-ed.2.0 :
IEC 60749-24:2025 specifies unbiased highly accelerated stress testing (HAST). HAST is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It is a highly accelerated test which employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it. Bias is not applied in this test to ensure that the failure mechanisms potentially overshadowed by bias can be uncovered (e.g. galvanic corrosion). This test is used to identify failure mechanisms internal to the package and is destructive. This edition includes the following significant technical changes with respect to the previous edition: a) rearrangement of clauses to reposition requirements; b) addition of two notes to the post-test electrical procedures. LIEC 60749-24:2025 specifie un essai fortement accelere de contrainte d’humidite (HAST, Highly Accelerated Stress Testing) sans polarisation. L’essai HAST est realise dans le but d’evaluer la fiabilite des dispositifs a l’etat solide sous boitiers non hermetiques dans des environnements humides. Il s’agit d’un essai fortement accelere qui utilise une temperature et une humidite dans des conditions sans condensation, pour accelerer la penetration d’humidite a travers le materiau de protection exterieur (agent d’enrobage ou de scellement) ou par l’interface entre le materiau de protection exterieur et les conducteurs metalliques qui le traversent. La polarisation n’est pas appliquee dans cet essai pour s’assurer que les mecanismes de defaillance potentiellement eclipses par la polarisation puissent etre decouverts (la corrosion galvanique, par exemple). Cet essai destructif est utilise pour identifier les mecanismes de defaillance internes au boitier. Cette edition inclut les modifications techniques majeures suivantes par rapport a ledition precedente: a) reorganisation des articles pour repositionner les exigences; b) ajout de deux notes aux procedures electriques apres l’essai.
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