Standard IEC 60749-27-ed.2.1+Amd.1-CSV 25.9.2012 preview

IEC 60749-27-ed.2.1+Amd.1-CSV

Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Translate name

STANDARD published on 25.9.2012


Language
Format
AvailabilityIN STOCK
Price242.40 USD excl. VAT
242.40 USD

The information about the standard:

Designation standards: IEC 60749-27-ed.2.1+Amd.1-CSV
Publication date standards: 25.9.2012
SKU: NS-1094755
The number of pages: 25
Approximate weight : 75 g (0.17 lbs)
Country: International technical standard
Category: Technical standards IEC

The category - similar standards:

Semiconductor devices in general

Annotation of standard text IEC 60749-27-ed.2.1+Amd.1-CSV :

IEC 60749-27:2006+A1:2012 Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive. This consolidated version consists of the second edition (2006) and its amendment 1 (2012). Therefore, no need to order amendment in addition to this publication. La CEI 60749-27:2006+A1:2012 Etablit une procedure normalisee pour les essais et les classements des dispositifs a semiconducteurs en fonction de leur sensibilite aux dommages ou a la degradation du fait de leur exposition a une decharge electrostatique (DES) sur un modele de machine (MM) defini. Elle peut etre utilisee comme une methode dessai en variante a la methode dessai de DES sur le modele du corps humain. Lobjectif est de fournir des resultats dessai de DES fiables et reproductibles de maniere a ce que des classifications precises puissent etre realisees. Cette methode dessai est applicable a tous les dispositifs a semiconducteurs et elle est classee destructive. Cette version consolidee comprend la deuxieme edition (2006) et son amendement 1 (2012). Il nest donc pas necessaire de commander lamendement avec cette publication.

We recommend:

Updating of laws

Do you want to be sure about the validity of used regulations?
We offer you a solution so that you could use valid and updated legislative regulations.
Would you like to get more information? Look at this page.




Cookies Cookies

We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.

You can refuse consent here.

Here you can customize your cookie settings according to your preferences.

We need your consent to use the individual data so that you can see information about your interests, among other things.