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IEC 60749-29-ed.2.0
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
STANDARD published on 7.4.2011
The information about the standard:
Designation standards: IEC 60749-29-ed.2.0
Publication date standards: 7.4.2011
SKU: NS-411395
The number of pages: 48
Approximate weight : 144 g (0.32 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 60749-29-ed.2.0 :
IEC 60749-29:2011 covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is toestablish a method for determining integrated circuit (IC) latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "no trouble found" (NTF) and "electrical overstress" (EOS) failures due to latch-up. This second edition cancels and replaces the first edition published in 2003 and constitutes a technical revision. The significant changes with respect to the previous edition include: - a number of minor technical changes; - the addition of two new annexes covering the testing of special pins and temperature calculations. La CEI 60749-29:2011 couvre lessai I et lessai de verrouillage de surtension des circuits integres. Lobjet de cet essai est detablir une methode pour determiner les caracteristiques de verrouillage des circuits integres (CI) et pour definir les criteres de defaillance de verrouillage. Les caracteristiques de verrouillage sont utilisees pour la determination de la fiabilite de produit et la minimisation des defaillances en rapport avec "labsence dobservation de problemes" (NTF, No Trouble Found) et la "contrainte electrique excessive" (EOS, Electrical Overstress) dues au verrouillage. Cette deuxieme edition annule et remplace la premiere edition publiee en 2003 et constitue une revision technique. Les modifications importantes apportees par rapport a ledition anterieure concernent: - un certain nombre de modifications techniques mineures; - laddition de deux nouvelles annexes traitant de lessai des broches speciales et des calculs de temperature.
