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IEC 60749-32-ed.1.1+Amd.1-CSV
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
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STANDARD published on 29.11.2010
The information about the standard:
Designation standards: IEC 60749-32-ed.1.1+Amd.1-CSV
Publication date standards: 29.11.2010
SKU: NS-1094759
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 60749-32-ed.1.1+Amd.1-CSV :
IEC 60749-32:2002+A1:2010 is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device. This consolidated version consists of the first edition (2002) and its amendment 1 (2010). Therefore, no need to order amendment in addition to this publication. La CEI 60749-32:2002+A1:2010 est applicable aux dispositifs a semiconducteurs (dispositifs discrets et circuits integres). Lobjet de cet essai est de determiner si le dispositif prend feu en raison dune chaleur exterieure. Lessai est pratique avec un bruleur-aiguille, simulant leffet de petites flammes pouvant resulter de mauvaises conditions apparaissant dans lequipement contenant le dispositif. Cette version consolidee comprend la premiere edition (2002) et son amendement 1 (2010). Il nest donc pas necessaire de commander lamendement avec cette publication.
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