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IEC 60749-36-ed.1.0
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
STANDARD published on 13.2.2003
The information about the standard:
Designation standards: IEC 60749-36-ed.1.0
Publication date standards: 13.2.2003
SKU: NS-411410
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 60749-36-ed.1.0 :
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test. Decrit un essai utilise pour determiner les effets dacceleration constante sur les dispositifs a semiconducteurs de type a cavite. Il sagit dun essai accelere destine a indiquer les types de faiblesses structurelles et mecaniques non necessairement detectees dans les essais de chocs et de vibrations.
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