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IEC 60749-4-ed.2.0
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
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STANDARD published on 3.3.2017
The information about the standard:
Designation standards: IEC 60749-4-ed.2.0
Publication date standards: 3.3.2017
SKU: NS-677381
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 60749-4-ed.2.0 :
IEC 60749-4:2017 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments. This edition includes the following significant technical changes with respect to the previous edition: a) clarification of requirements for temperature, relative humidity and duration detailed in Table 1; b) recommendations that current limiting resistor(s) be placed in the test set-up to prevent test board or DUT damage; c) allowance of additional time-to-test delay or return-to-stress delay. L’IEC 60749-4:2017 decrit un essai de contrainte de temperature et d’humidite fortement accelere (HAST, highly accelerated temperature and humidity stress test) qui est realise dans le but d’evaluer la fiabilite des dispositifs a semiconducteurs sous boitier non hermetique dans les environnements humides. Cette edition inclut les modifications techniques majeures suivantes par rapport a l’edition precedente: a) clarification des exigences relatives a la temperature, a l’humidite relative et a la duree d’exposition, detaillees dans le Tableau 1; b) ajout de recommandations suggerant de placer une ou des resistances dans le montage d’essai, afin d’eviter d’endommager la carte d’essai ou le dispositif soumis a essai (DUT, Device Under Test); c) specification d’une autorisation d’extension du temps d’etablissement des conditions d’essai ou du temps de retour a la contrainte.
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