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IEC 60749-41-ed.1.0
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
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STANDARD published on 22.7.2020
The information about the standard:
Designation standards: IEC 60749-41-ed.1.0
Publication date standards: 22.7.2020
SKU: NS-1000955
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 60749-41-ed.1.0 :
IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94. L’IEC 60749-41:2020 specifie les exigences relatives aux procedures permettant de realiser des essais valides d’endurance, de conservation de donnees et a temperatures opposees, basees sur une specification de qualification. Les specifications de qualification des essais d’endurance et de conservation de donnees (pour les nombres de cycles, durees, temperatures et tailles d’echantillon) sont donnees dans le document JESD47 ou sont developpees en utilisant des methodes a base de connaissances, telles que celles donnees dans le document JESD94.
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