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IEC 60759-ed.1.0
Standard test procedures for semiconductor X-ray energy spectrometers
STANDARD published on 1.1.1983
The information about the standard:
Designation standards: IEC 60759-ed.1.0
Publication date standards: 1.1.1983
SKU: NS-411435
The number of pages: 97
Approximate weight : 322 g (0.71 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 60759-ed.1.0 :
Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer. Donne les methodes dessais normalises des spectrometres denergie X a semicteur constitues dun semicteur et de lelectronique de traitement du signal lies par une interface a un analyseur damplitude couple a un calculateur.
These changes apply to this standard:
IEC 60759-ed.1.0/Amd.1
Change
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Amendment 1 - Standard test procedures for semiconductor X-ray energy spectrometers
(Amendement 1 - Methodes d´essais normalises des spectrometres d´energie X a semicteur)
Change published on 15.11.1991
Selected format:Show all technical information.
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