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IEC 61000-4-20-ed.3.0
Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
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STANDARD published on 18.2.2022
The information about the standard:
Designation standards: IEC 61000-4-20-ed.3.0
Publication date standards: 18.2.2022
SKU: NS-1050636
The number of pages: 229
Approximate weight : 718 g (1.58 lbs)
Country: International technical standard
Category: Technical standards IEC
Annotation of standard text IEC 61000-4-20-ed.3.0 :
IEC 61000-4-20:2022 focuses on emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open structures (for example striplines and electromagnetic pulse simulators) and closed structures (for example TEM cells). These structures can be further classified as one-port, two-port, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this document is to describe TEM waveguide characteristics, including typical frequency ranges and equipment-under-test (EUT) size limitations; TEM waveguide validation methods for electromagnetic compatibility (EMC) tests; the EUT (i.e. EUT cabinet and cabling) definition; test set-ups, procedures, and requirements for radiated emission measurements in TEM waveguides; and test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides. NOTE Test methods are defined in this document to measure the effects of electromagnetic radiation on equipment and the electromagnetic emissions from the equipment concerned. The simulation and measurement of electromagnetic radiation is not adequately exact for the quantitative determination of effects for all end-use installations. The test methods defined are structured for a primary objective of establishing adequate reproducibility of results at various test facilities for qualitative analysis of effects. This document does not intend to specify the tests to be applied to any particular apparatus or system(s). The main intention of this document is to provide a general basic reference for all interested product committees of the IEC. For radiated emission measurements, product committees select emission limits and measurement methods in consultation with CISPR standards. For radiated immunity testing, product committees remain responsible for the appropriate choice of immunity tests and immunity test limits to be applied to equipment within their scope. This document describes test methods that are separate from those of IEC 61000-4-3. This third edition cancels and replaces the second edition published in 2010. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: provide information on the testing of large EUTs (including cables); apply the work on measurement uncertainties by adapting the work completed in CISPR and TC 77 (for emissions and immunity); update the validation procedure for the test volume regarding field uniformity and TEM mode verification; provide information concerning two-port and four-port TEM waveguides; add a new informative annex (Annex I) dealing with transient TEM waveguide characterization; and add information dealing with dielectric test stands for EUTs. IEC 61000-4-20:2022 concerne les methodes d’essai d’emission et d’immunite pour les materiels electriques et electroniques qui utilisent differents types de guides d’onde transverses electromagnetiques (TEM). Ces types comprennent des structures ouvertes (par exemple, des lignes ouvertes et des simulateurs d’impulsion electromagnetique), et des structures fermees (par exemple, des cellules TEM), qui peuvent etre elles-memes classees en guides d’onde TEM a un acces, a deux acces, ou a acces multiples. La plage de frequences depend des exigences d’essai specifiques et du type specifique de guide d’onde TEM. L’objet du present document est de decrire les caracteristiques des guides d’onde TEM, y compris les plages de frequences types et les limites de tailles des equipements en essai (EUT); les methodes de validation des guides d’onde TEM pour les essais de compatibilite electromagnetique CEM; la definition de lEUT (c’est-a-dire l’armoire et le cablage de lEUT); les montages d’essai, les procedures et les exigences relatives aux mesurages d’emissions rayonnees dans les guides d’onde TEM; et les montages dessai, les procedures et les exigences pour les essais d’immunite rayonnee dans les guides d’onde TEM. NOTE Dans le present document, les methodes d’essai sont definies afin de mesurer les effets des rayonnements electromagnetiques sur les materiels et les emissions electromagnetiques des materiels concernes. La simulation et le mesurage des rayonnements electromagnetiques ne sont pas suffisamment exacts pour une determination quantitative des effets sur toutes les installations dutilisation finale. Les methodes d’essai definies sont structurees avec l’objectif premier detablir une reproductibilite adequate des resultats dans differentes installations d’essai pour des analyses qualitatives des effets. Le present document ne vise pas a specifier les essais a appliquer a des appareils ou a un ou des systemes particuliers. Le but principal present document est de donner une reference de base dordre general a tous les comites de produits IEC concernes. Pour les mesurages d’emission rayonnee, les comites de produits selectionnent des limites d’emission et des methodes de mesure en consultation avec les normes CISPR. Pour les essais d’immunite rayonnee, les comites de produits restent responsables du choix approprie des essais d’immunite et des limites qui y sont associees, a appliquer aux materiels qui relevent de leur domaine d’application. Le present document decrit des methodes dessai qui sont independantes de celles de lIEC 61000-4-3 [34]. CEM conformement au Guide IEC 107. Cette troisieme edition annule et remplace la deuxieme edition parue en 2010. Cette edition constitue une revision technique. Cette edition inclut les modifications techniques majeures suivantes par rapport a ledition precedente: a) fournir des informations relatives aux essais dEUT volumineux (y compris les cables); b) appliquer les travaux sur les incertitudes de mesure par adaptation des travaux realises par le CISPR et le CE 77 (pour les emissions e
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