IEC 61010-031-ed.3.0-CMV

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Electrical and electronic testing

Annotation of standard text IEC 61010-031-ed.3.0-CMV :

IEC 61010-031:2022 CMV contains both the official standard and its commented version. The commented version provides you with a quick and easy way to compare all the changes between IEC 61010-031:2022 edition 3.0 and the previous IEC 61010-031:2015+AMD1:2018 CSV edition 2.1. Furthermore, comments from IEC TC 66 experts are provided to explain the reasons of the most relevant changes, or to clarify any part of the content. IEC 61010-031:2022 specifies safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement, and their related accessories. These probe assemblies are for non-contact or direct electrical connection between a part and electrical test and measurement equipment. They can be fixed to the equipment or be detachable accessories for the equipment. It has the status of a group safety publication in accordance with IEC Guide 104. This third edition cancels and replaces the second edition published in 2015, and Amendment 1:2018. IEC 61010-031 is a stand-alone standard. This edition includes the following significant technical changes with respect to the previous edition:

1. the scope has been made succinct. General information from the scope of Edition 2 has been moved to a new Clause 4. Consequently, Clause 4 to Clause 8 of Edition 2 have been renumbered. Clause 9 of Edition 2 has been deleted;
2. in Clause 2, normative references have been dated and new normative references have been added;
3. in 3.1.4, the definition of probe tip has been modified;
4. in 4.1, there is no longer any differentiation between high voltage and low voltage probe assemblies. Type C probe assemblies have been merged with Type B probe assemblies;
5. in 4.1 d) "Kelvin" probes have been added to the list of probe assemblies as a new Type E and a new Figure 5;
6. in 4.1 e), probes for voltage measurement without electrical connection to conductors have been added to the list of probe assemblies as a new Type F and a new Figure 6;
7. in 4.2.1, spread of fire is no longer considered as a hazard;
8. Subclause 4.4.2.5 from Edition 2 has been deleted;
9. Subclause 4.4.4.3 from Edition 2 has been deleted;
10. in 5.4.4.1 consideration has been given to spacings and impedance;
11. in 6.1.1, removable parts of probe tips which bear markings are allowed;
12. in 6.1.5, the voltage to be marked for measurement categories is the AC line-to-neutral or DC voltage;
13. in 7.4.2, requirements for unmated connectors have been modified as follows:
    1. Table 2 has been modified and expanded,
    2. a calculation method for clearances of connectors above 20 kV has been defined,
    3. creepage distances have been aligned with clearances;
14. in 7.4.3.1 and 7.4.3.5, requirements for IP2X probe tips with retractable sleeve have been added;
15. in 7.4.3.2, Probe tips are now applicable to non-contact probe assemblies;
16. in 7.5.2.3.2, the values of Table 5 have been modified;
17. in 7.6.2, voltage tests of clearances are done without humidity preconditioning;
18. pre-treatments for rigidity test from Clause 10 of Edition 2 have been moved to 9.2;
19. Subclause 11.1 of Edition 2 has been deleted;
20. addition of an exception for Type E probe assembly in 13.2. Removable parts of probe tips which bear markings are allowed;
21. Figure F.1 has been modified;
22. Annex G has been added, for determination of clearances for Table 2;
23. Annex H has been added, covering line-to-neutral voltages for common mains supply systems.