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IEC 61163-1-ed.2.0
Reliability stress screening - Part 1: Repairable assemblies manufactured in lots
STANDARD published on 26.6.2006
The information about the standard:
Designation standards: IEC 61163-1-ed.2.0
Publication date standards: 26.6.2006
SKU: NS-412629
The number of pages: 161
Approximate weight : 514 g (1.13 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Quality in generalApplication of statistical methodsCharacteristics and design of machines, apparatus, equipment
Annotation of standard text IEC 61163-1-ed.2.0 :
This part of IEC 61163 describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an unacceptably low reliability in the early failure period, and when other methods, such as reliability growth programmes and quality control techniques, are not applicable. La presente partie de la CEI 61163 decrit les methodes a suivre pour appliquer et optimiser des processus de deverminage sous contraintes de lots dassemblages reparables, lorsque le niveau de fiabilite de ces assemblages est trop faible et inacceptable pendant la periode de defaillances precoces et que dautres methodes telles que les programmes de croissance de fiabilite et techniques de maitrise de la qualite ne sont pas applicables
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