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IEC 61164-ed.2.0
Reliability growth - Statistical test and estimation methods
STANDARD published on 24.3.2004
The information about the standard:
Designation standards: IEC 61164-ed.2.0
Publication date standards: 24.3.2004
SKU: NS-412631
The number of pages: 111
Approximate weight : 364 g (0.80 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 61164-ed.2.0 :
IEC 61164:2004 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests. The main changes with respect to the previous edition are: - addition of two statistical models for reliability growth planning and tracking in the product design phase; - statistical methods for the reliability growth programme in the design phase of IEC 61014; - addition of the discrete reliability growth model for the test phase; - addition of the fixed number of faults model for the test phase, clarification of the symbols used for various models; - addition of real lif examples for most of the statistical models; - numerical correction of tables in the reliability growth test example. This publication is to be read in conjunction with IEC 61014:2003. La CEI 61164:2004 fournit des modeles et methodes numeriques permettant deffectuer des estimations de la croissance de la fiabilite basees sur des donnees de defaillance elaborees au cours dun programme damelioration de la fiabilite. Ces procedures traitent de la croissance, de lestimation et des intervalles de confiance pour les essais de fiabilite du produit et dadequation. Les principales modifications par rapport a ledition precedente sont: - ajout de deux modeles statistiques de planification et de suivi de la croissance de la fiabilite en phase de conception du produit; - methodes statistiques pour le programme relatif a la croissance de la fiabilite en phase de conception de la CEI 61014; - ajout du modele discret de croissance de la fiabilite pour la phase dessai; - ajout du nombre fixe de modeles de panne pour la phase dessai; - clarification des symboles utilises pour les differents modeles; - ajout dexemples concrets pour la plupart des modeles statistiques; - correction numerique des tableaux dans lexemple de test de croissance de la fiabilite. Cette publication doit etre lue conjointement avec la CEI 61014:2003.
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