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Test methods for electrical materials, circuit boards and other interconnection structures and assemblies - Part 2-720: Detection of defects in interconnection structures by measurement of capacitance
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STANDARD published on 6.3.2024
Designation standards: IEC 61189-2-720-ed.1.0
Publication date standards: 6.3.2024
SKU: NS-1168208
The number of pages: 21
Approximate weight : 63 g (0.14 lbs)
Country: International technical standard
Category: Technical standards IEC
IEC 61189-2-720:2024 provides a method to evaluate specific characteristics of circuit boards by measuring the capacitance between conductor traces and a ground plane and can be used for qualitative comparison of a test specimen to a reference board. This method is not intended for quantitative measurements and for assessment of conformity to a specification. L’IEC 61189-2-720:2024 fournit une methode pour evaluer les caracteristiques specifiques des circuits imprimes en mesurant la capacite entre les traces conductrices et un plan de masse. Elle peut etre utilisee pour etablir une comparaison qualitative dun specimen dessai par rapport a un circuit de reference. Cette methode nest pas destinee aux mesures quantitatives ni a levaluation de la conformite a une specification.
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