Standard IEC 61189-2-805-ed.1.0 18.4.2024 preview

IEC 61189-2-805-ed.1.0

Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 2-805: X/Y CTE test for thin base materials by TMA

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STANDARD published on 18.4.2024


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The information about the standard:

Designation standards: IEC 61189-2-805-ed.1.0
Publication date standards: 18.4.2024
SKU: NS-1182408
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEC

The category - similar standards:

Printed circuits and boards

Annotation of standard text IEC 61189-2-805-ed.1.0 :

IEC 61189-2-805:2024 defines the method to be followed for the determination of the X/Y coefficient of thermal expansion of thin electrical insulating materials via the use of a thermomechanical analyser (TMA). This method is applicable to materials that are solid for the entire range of temperature used, and that retain sufficient rigidity over the temperature range so that so that irreversible indentation of the specimen by the sensing probe does not occur. L’IEC 61189-2-805:2024 definit la methode a suivre pour la determination du coefficient de dilatation thermique X/Y de materiaux isolants electriques minces par l’utilisation d’un analyseur thermomecanique (TMA, thermomechanical analyser). Cette methode est applicable aux materiaux qui sont solides sur toute la plage de temperatures utilisee et qui conservent une rigidite suffisante sur toute la plage de temperatures, de telle sorte quune indentation irreversible du specimen par la sonde de detection ne se produise pas.



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