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IEC 61788-15-ed.2.0
Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies
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STANDARD published on 23.3.2026
The information about the standard:
Designation standards: IEC 61788-15-ed.2.0
Publication date standards: 23.3.2026
SKU: NS-1265896
The number of pages: 126
Approximate weight : 409 g (0.90 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Measurement of electrical and magnetic quantitiesConducting materials
Annotation of standard text IEC 61788-15-ed.2.0 :
IEC 61788-15:2026 describes measurements of the intrinsic surface impedance (Zs) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method. The object of measurement is to obtain the temperature dependence of the intrinsic Zs at the resonant frequency f0. The frequency and thickness range and the measurement resolution for the Zs of HTS films are as follows: - frequency: up to 40 GHz; - film thickness: greater than 50 nm; - measurement resolution: 0,01 mohm at 10 GHz. It is crucial that the Zs data at the measured frequency, and that scaled to 10 GHz be reported for comparison, assuming the f2 rule for the intrinsic surface resistance, Rs (f < 40 GHz), and the f rule for the intrinsic surface reactance, Xs. This second edition cancels and replaces the first edition published in 2011. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: - informative Annex B, combined relative standard uncertainty in the intrinsic surface impedance is added; - the terms, ‘precision and accuracy’, are replaced with uncertainty; - results from a round robin test are added. LIEC 61788-15:2026 decrit les mesures de limpedance de surface intrinseque (Zs) des films HTS aux frequences micro-ondes par une methode modifiee du resonateur dielectriques en mode deux resonances. Lobjet de la mesure est dobtenir la dependance de limpedance intrinseque Zs vis-a-vis de la temperature a la frequence de resonance f0. La plage de frequences et depaisseurs et la resolution de mesure pour limpedance Zs des films HTS sont les suivantes: - frequence: jusqua 40 GHz; - epaisseur du film: superieure a 50 nm; - resolution de mesure: 0,01 mohm a 10 GHz. Il est crucial que les donnees Zs a la frequence mesuree et celles normalisees a 10 GHz soient consignees a des fins de comparaison, en prenant pour hypothese la regle f2 pour la resistance de surface intrinseque RS (f < 40 GHz) et la regle f pour la reactance de surface intrinseque Xs. Cette deuxieme edition annule et remplace la premiere edition parue en 2011. Cette edition constitue une revision technique. Cette edition inclut les modifications techniques majeures suivantes par rapport a ledition precedente: - lAnnexe B informative, concernant lincertitude type relative composee de limpedance de surface intrinseque, a ete ajoutee; - les termes "fidelite" et "exactitude" ont ete remplaces par "incertitude"; - les resultats dun essai comparatif interlaboratoire ont ete ajoutes.
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