Standard IEC 61967-4-ed.2.0-RLV 16.3.2021 preview

IEC 61967-4-ed.2.0-RLV

Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method

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STANDARD published on 16.3.2021


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The information about the standard:

Designation standards: IEC 61967-4-ed.2.0-RLV
Publication date standards: 16.3.2021
SKU: NS-1095845
The number of pages: 133
Approximate weight : 430 g (0.95 lbs)
Country: International technical standard
Category: Technical standards IEC

The category - similar standards:

Integrated circuits. Microelectronics

Annotation of standard text IEC 61967-4-ed.2.0-RLV :

IEC 61967-4:2021 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition. IEC 61967-4:2021 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods ensure a high degree of reproducibility and correlation of EME measurement results. This edition includes the following significant technical changes with respect to the previous edition: - frequency range of 150 kHz to 1 GHz has been deleted from the title; - recommended frequency range for 1 ohm method has been reduced to 30 MHz; - Annex G with recommendations and guidelines for frequency range extension beyond 1 GHz has been added.

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