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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
STANDARD published on 25.6.2002
Designation standards: IEC 61967-6-ed.1.0
Publication date standards: 25.6.2002
SKU: NS-413960
The number of pages: 51
Approximate weight : 153 g (0.34 lbs)
Country: International technical standard
Category: Technical standards IEC
Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz. The contents of the corrigendum of August 2010 have been included in this copy. Specifie une methode pour levaluation des courants RF sur les broches dun circuit integre par la mesure du courant sans contact en utilisant une sonde magnetique miniature. Cette methode permet de mesurer les courants RF generes par le circuit integre (CI) dans une plage de frequences allant de 0,15 MHz a 1 000 MHz. Le contenu du corrigendum daout 2010 a ete pris en consideration dans cet exemplaire.
Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
(Amendement 1 - Circuits integres - Mesure des emissions electromagnetiques, 150 kHz a 1 GHz - Partie 6: Mesure des emissions conduites - Methode de la sonde magnetique)
Change published on 12.3.2008
Selected format:
Corrigendum 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
(Corrigendum 1 - Circuits integres - Mesure des emissions electromagnetiques, 150 kHz a 1 GHz - Partie 6: Mesure des emissions conduites - Methode de la sonde magnetique)
Correction published on 30.8.2010
Selected format:1.4.1992
20.12.1990
1.10.1991
21.12.1994
12.4.1999
30.1.2001
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