Standard IEC 61967-8-ed.2.0-RLV 3.5.2023 preview

IEC 61967-8-ed.2.0-RLV

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

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STANDARD published on 3.5.2023


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The information about the standard:

Designation standards: IEC 61967-8-ed.2.0-RLV
Publication date standards: 3.5.2023
SKU: NS-1143016
The number of pages: 52
Approximate weight : 156 g (0.34 lbs)
Country: International technical standard
Category: Technical standards IEC

The category - similar standards:

Integrated circuits. Microelectronics

Annotation of standard text IEC 61967-8-ed.2.0-RLV :

IEC 61967-8:2023 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition. IEC 61967-8:2023 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement. This edition includes the following significant technical changes with respect to the previous edition: a) frequency range of 150 kHz to 3 GHz was deleted from the scope; b) extension of upper usable frequency to 6 GHz or higher as long as the defined requirements are fulfilled.

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