Cookies
We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
IEC 62047-34-ed.1.0
Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Translate name
STANDARD published on 5.4.2019
The information about the standard:
Designation standards: IEC 62047-34-ed.1.0
Publication date standards: 5.4.2019
SKU: NS-945688
The number of pages: 16
Approximate weight : 48 g (0.11 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Other semiconductor devicesPiezoelectric and dielectric devices
Annotation of standard text IEC 62047-34-ed.1.0 :
IEC 62047-34:2019 (E) describes test conditions and test methods of electric character, static performances and thermal performances for MEMS pressure-sensitive devices. This document applies to test for both open and closed loop piezoresistive MEMS pressure devices on wafer.
We recommend:
Technical standards updating
Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.
Would you like to know more? Look at this page.
