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IEC 62215-3-ed.1.0
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
STANDARD published on 17.7.2013
The information about the standard:
Designation standards: IEC 62215-3-ed.1.0
Publication date standards: 17.7.2013
SKU: NS-414300
The number of pages: 66
Approximate weight : 198 g (0.44 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 62215-3-ed.1.0 :
IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range. La CEI 62215-3:2013 specifie une methode pour mesurer limmunite dun circuit integre (CI) aux perturbations transitoires electriques conduites normalisees. Les perturbations, non necessairement synchronisees sur le fonctionnement du dispositif en essai (DUT, device under test), sont appliquees aux broches du circuit integre via des reseaux de couplage. Cette methode permet de comprendre et de classer les interactions entre des perturbations transitoires conduites et la degradation de fonctionnement induite dans les circuits integres independamment des transitoires a linterieur ou au-dela de la gamme de tensions de fonctionnement specifiees.
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