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IEC 62374-ed.1.0
Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
STANDARD published on 29.3.2007
The information about the standard:
Designation standards: IEC 62374-ed.1.0
Publication date standards: 29.3.2007
SKU: NS-414555
The number of pages: 43
Approximate weight : 129 g (0.28 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 62374-ed.1.0 :
Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure Cette norme decrit une methode d essai de la rupture dielectrique en fonction du temps (TDDB) pour films dielectriques de grille des dispositifs a semiconducteurs et une methode d estimation de la duree de vie de produit en presence d unedefaillance de type TDDB.
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