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IEC 62525-ed.1.0
Standard Test Interface Language (STIL) for Digital Test Vector Data
STANDARD published on 7.11.2007
The information about the standard:
Designation standards: IEC 62525-ed.1.0
Publication date standards: 7.11.2007
SKU: NS-414728
The number of pages: 143
Approximate weight : 460 g (1.01 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Industrial automation systems in generalElectrical and electronic testing
Annotation of standard text IEC 62525-ed.1.0 :
Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.
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