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IEC 62526-ed.1.0
Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
STANDARD published on 7.11.2007
The information about the standard:
Designation standards: IEC 62526-ed.1.0
Publication date standards: 7.11.2007
SKU: NS-414729
The number of pages: 123
Approximate weight : 400 g (0.88 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 62526-ed.1.0 :
Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.
