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Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification
STANDARD published on 7.11.2007
Designation standards: IEC 62527-ed.1.0
Publication date standards: 7.11.2007
SKU: NS-414730
The number of pages: 39
Approximate weight : 117 g (0.26 lbs)
Country: International technical standard
Category: Technical standards IEC
STIL language constructs are defined to specify the DC conditions necessary to excute digital vectors on automated test equipment(ATE). STIL language extensions include structures for:(a) specifying the DC conditions for a device under test; specifying DC conditions either globally, by pattern burst, by pattern, or by vector;(c) specifying alternate DC levels;and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.
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Latest update: 2025-09-14 (Number of items: 2 232 183)
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