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IEC 63185-ed.1.0
Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method
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STANDARD published on 8.12.2020
The information about the standard:
Designation standards: IEC 63185-ed.1.0
Publication date standards: 8.12.2020
SKU: NS-1012006
The number of pages: 25
Approximate weight : 75 g (0.17 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 63185-ed.1.0 :
IEC 63185:2020 relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes is taken into account accurately on the basis of the mode-matching analysis. l’IEC 63185:2020 traite d’une methode de mesure de la permittivite complexe des substrats dielectriques aux hyperfrequences et aux frequences a ondes millimetriques. Cette methode a ete elaboree pour evaluer les proprietes dielectriques des materiaux a faible perte utilises dans les circuits et dispositifs hyperfrequences et a ondes millimetriques. Cette methode utilise des modes d’ordre superieur d’un resonateur a disque circulaire de type symetrique et permet d’effectuer, a l’aide d’un resonateur, des mesurages a large bande de substrats dielectriques, dont l’effet des trous d’excitation est pris en compte avec exactitude sur la base de l’analyse de couplage de mode.
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