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IEC 63616-ed.1.0
Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method
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STANDARD published on 28.11.2025
The information about the standard:
Designation standards: IEC 63616-ed.1.0
Publication date standards: 28.11.2025
SKU: NS-1249245
The number of pages: 26
Approximate weight : 78 g (0.17 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Measurement of electrical and magnetic quantitiesConducting materials
Annotation of standard text IEC 63616-ed.1.0 :
IEC 63616:2025 relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivity of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator. LIEC 63616:2025 traite d’une methode de mesurage de la conductivite de films metalliques minces aux hyperfrequences et aux frequences a ondes millimetriques. Cette methode a ete elaboree pour evaluer la conductivite d’une feuille metallique utilisee pour adherer a un substrat ou la conductivite interfaciale d’une couche metallique formee sur un substrat dielectrique. Elle utilise des modes d’ordre superieur d’un resonateur a disque circulaire de type symetrique et permet d’effectuer, a l’aide d’un seul resonateur, des mesurages de conductivite a large bande.
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