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IEC/TR 62433-4-1-ed.1.0
EMC IC modelling - Part 4-1: Use of ICIM-CI model to predict the IC conducted immunity in a PCB
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STANDARD published on 26.8.2025
The information about the standard:
Designation standards: IEC/TR 62433-4-1-ed.1.0
Publication date standards: 26.8.2025
SKU: NS-1238949
The number of pages: 40
Approximate weight : 120 g (0.26 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC/TR 62433-4-1-ed.1.0 :
IEC TR 62433-4-1:2025 provides an overview of good practices to extract an ICIM-CI model from measurements and to build a numerical model of the PCB in which the ICIM-CI model is used to predict RF immunity of an IC in its application PCB. This document also discusses factors which can be considered to obtain proper results in an ICIM-CI model extraction and use of the actual model at the PCB level.
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