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IEC/TS 61586-ed.2.0
Estimation of the reliability of electrical connectors
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STANDARD published on 25.1.2017
The information about the standard:
Designation standards: IEC/TS 61586-ed.2.0
Publication date standards: 25.1.2017
SKU: NS-674416
The number of pages: 55
Approximate weight : 165 g (0.36 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC/TS 61586-ed.2.0 :
IEC TS 61586:2017 deals with the estimation of the inherent design reliability of electrical connectors through the definition and development of an appropriate accelerated testing programme. The basic intrinsic degradation mechanisms of connectors, which are those mechanisms which exist as a result of the materials and geometries chosen for the connector design, are reviewed to provide a context for the development of the desired test programme. While extrinsic degradation mechanisms may also significantly affect the performance of connectors, they vary widely by application and thus are not addressed in this document. This second edition cancels and replaces the first edition published in 1997. This edition constitutes a technical revision. The main technical changes with regard to the previous edition are as follows: A specific “basic” testing protocol is defined which utilizes a single test group subjecting connectors to multiple stresses, Additional information is provided concerning test acceleration factors, A discussion of the limitations of providing MTTF/MTBF estimates for connectors has been added and the bibliography has been expanded. IEC TS 61586:2017 traite de l’estimation de la fiabilite inherente a la conception des connecteurs electriques par la definition et le developpement de programmes d’essais acceleres appropries. Les mecanismes de degradation intrinseque elementaire des connecteurs, qui sont lies au choix des materiaux et de la geometrie utilises dans leur conception, sont examines afin de fournir un contexte pour le developpement des programmes d’essais souhaites. Bien que les mecanismes de degradation intrinseque puissent avoir des consequences significatives sur les performances des connecteurs, ils divergent largement d’une application a l’autre; ils ne sont donc pas traites dans le present document. Cette deuxieme edition annule et remplace la premiere edition parue en 1997. Cette edition constitue une revision technique. Les principales modifications techniques par rapport a ledition precedente sont les suivantes:Un protocole de test «de base» specifique est defini qui utilise un seul groupe de test soumettant les connecteurs a de multiples contraintes, des informations supplementaires sont fournies sur les facteurs dacceleration de test, une discussion sur les limites de la fourniture des estimations MTTF / MTBF pour les connecteurs a ete ajoutee et la bibliographie a ete elargie. Mots cles: connecteurs, fiabilite, intrinseque, extrinseque
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