We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration
Translate name
STANDARD published on 14.4.2020
Designation standards: IEC/TS 62607-5-3-ed.1.0
Publication date standards: 14.4.2020
SKU: NS-992330
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: International technical standard
Category: Technical standards IEC
IEC TS 62607-5-3:2020 specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.
Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.
Would you like to know more? Look at this page.
Latest update: 2024-05-17 (Number of items: 2 902 148)
© Copyright 2024 NORMSERVIS s.r.o.