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IEC/TS 62607-6-14-ed.1.0
Nanomanufacturing - Key control characteristics - Part 6-14: Graphene-based material - Defect level: Raman spectroscopy
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STANDARD published on 27.10.2020
The information about the standard:
Designation standards: IEC/TS 62607-6-14-ed.1.0
Publication date standards: 27.10.2020
SKU: NS-1008659
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC/TS 62607-6-14-ed.1.0 :
IEC TS 62607-6-14:2020 establishes a standardized method to determine the structural key control characteristic • defect level for powders consisting of graphene-based material by • Raman spectroscopy. The defect level is derived by the intensity ratio of the D+D band and 2D band in Raman spectrum, ID+D/I2D. • The defect level determined in accordance with this document will be listed as a key control characteristic in the blank detail specification for graphene IEC 62565-3-1 for graphene powder. • The method is applicable for graphene powder or graphene-based material, e.g. reduced graphene oxide (rGO), bilayer graphene, trilayer graphene and few-layer graphene. • Typical application areas are quality control and classification for graphene manufacturers, and product selection for downstream users. • The method described in this document is appropriate if the physical form of graphene is powder.
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