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IEC/TS 62607-6-26-ed.1.0
Nanomanufacturing - Key control characteristics - Part 6-26: Graphene-related products - Fracture strain and stress, Young’s modulus, residual strain and residual stress: bulge test
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STANDARD published on 10.12.2025
The information about the standard:
Designation standards: IEC/TS 62607-6-26-ed.1.0
Publication date standards: 10.12.2025
SKU: NS-1252440
The number of pages: 26
Approximate weight : 78 g (0.17 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC/TS 62607-6-26-ed.1.0 :
IEC TS 62607-6-26:2025, which is a Technical Specification, establishes a standardized method to determine the mechanical key control characteristics (KCCs) • Youngs modulus (or elastic modulus), • residual strain, • residual stress, and • fracture stress of 2D materials and nanoscale films using the • bulge test. The bulge test is a reliable method where a pressure differential is applied to a freestanding film, and the resulting deformation is measured to derive the mechanical properties. • This method is applicable to a wide range of freestanding 2D materials, such as graphene, and nanometre-thick films with thicknesses typically ranging from 1 nm to several hundred nanometres. • This document ensures the characterization of mechanical properties essential for assessing the structural integrity and performance of materials in applications such as composite additives, flexible electronics, and energy harvesting devices.
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