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IEC/TS 62607-6-6-ed.1.0
Nanomanufacturing - Key control characteristics - Part 6-6: Graphene - Strain uniformity: Raman spectroscopy
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STANDARD published on 14.10.2021
The information about the standard:
Designation standards: IEC/TS 62607-6-6-ed.1.0
Publication date standards: 14.10.2021
SKU: NS-1041432
The number of pages: 27
Approximate weight : 81 g (0.18 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC/TS 62607-6-6-ed.1.0 :
IEC TS 62607-6-6:2021(E) establishes a standardized method to determine the structural key control characteristic • strain uniformity for single-layer graphene by • Raman spectroscopy. The width of the 2D-peak in the Raman spectrum is analysed to calculate the strain uniformity parameter which is a figure of merit to quantify the influence of nano-scale strain variations on the electronic properties of the layer. The classification will help manufacturers to classify their material quality to provide an upper limit of the electronic performance of the characterized graphene, to decide whether or not the graphene material quality is potentially suitable for various applications.
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