Standard IEC/TS 62607-8-1-ed.1.0 9.4.2020 preview

IEC/TS 62607-8-1-ed.1.0

Nanomanufacturing - Key control characteristics - Part 8-1: Nano-enabled metal-oxide interfacial devices - Test method for defect states by thermally stimulated current

Translate name

STANDARD published on 9.4.2020


Language
Format
AvailabilityIN STOCK
Price251.30 USD excl. VAT
251.30 USD

The information about the standard:

Designation standards: IEC/TS 62607-8-1-ed.1.0
Publication date standards: 9.4.2020
SKU: NS-990661
The number of pages: 29
Approximate weight : 87 g (0.19 lbs)
Country: International technical standard
Category: Technical standards IEC

The category - similar standards:

Physics. Chemistry

Annotation of standard text IEC/TS 62607-8-1-ed.1.0 :

IEC TS 62607-8-1:2020 There are two types of thermally stimulated current (TSC) measurement methods, classified by the origin of the current. One is generated by the detrapping of charges. The other one is generated by depolarization. IEC TS 62607-8-1:2020 focuses on the former method, and specifies the measurement method to be developed for determining defect states of nano-enabled metal-oxide interfacial devices. IEC TS 62607-8-1:2020 includes: – outlines of the experimental procedures used to measure TSC, – methods of interpretation of results and discussion of data analysis, and – case studies.

We recommend:

Technical standards updating

Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.

Would you like to know more? Look at this page.




Cookies Cookies

We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.

You can refuse consent here.

Here you can customize your cookie settings according to your preferences.

We need your consent to use the individual data so that you can see information about your interests, among other things.