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IEC/TS 62607-8-4-ed.1.0
Nanomanufacturing – Key control characteristics – Part 8-4: Metal-oxide interfacial devices – Activation energy of electronic trap states: Low-frequency-noise spectroscopy
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STANDARD published on 16.12.2024
The information about the standard:
Designation standards: IEC/TS 62607-8-4-ed.1.0
Publication date standards: 16.12.2024
SKU: NS-1209107
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC/TS 62607-8-4-ed.1.0 :
IEC 62607-8-4:2024 specifies a measurement protocol to determine the key control characteristic - activation energy of electronic trap states for metal-oxide interfacial devices by - low-frequency-noise spectroscopy The noise spectra peak temperatures are obtained within a designated temperature range. Activation energies are then calculated based on the frequency dependence of the peak temperatures to analyse the energy levels associated with the electronic trap states. The activation energy is determined by the temperature dependence of the capture time at electron traps under the assumption that it is described by an Arrhenius function. - In metal-oxide interfacial devices, electrical conductance is observed through an oxide nanolayer sandwiched between metal electrodes. - The size of the conductive path in metal-oxide interfacial devices is dependent on the current value and is usually nanoscale in diameter, taking the form of a filamentary wire. This evaluation method is useful for analysing the electronic trap states in nanowires and other miniaturized devices that have nanolayers.
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