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IEC/TS 62804-2-ed.1.0
Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation - Part 2: Thin-film
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STANDARD published on 29.3.2022
The information about the standard:
Designation standards: IEC/TS 62804-2-ed.1.0
Publication date standards: 29.3.2022
SKU: NS-1052618
The number of pages: 44
Approximate weight : 132 g (0.29 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC/TS 62804-2-ed.1.0 :
IEC TS 62804-2:2022 defines apparatus and procedures to test and evaluate the durability of photovoltaic (PV) modules to power loss by the effects of high voltage stress in a damp heat environment, referred to as potential-induced degradation (PID). This document defines a test method that compares the coulomb transfer between the active cell circuit and ground through the module packaging under voltage stress during accelerated stress testing with the coulomb transfer during outdoor testing to determine an acceleration factor for the PID. This document tests for the degradation mechanisms involving mobile ions influencing the electric field over the semiconductor absorber layer or electronically interacting with the films such that module power is affected.
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