We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Photovoltaic cells - Part 2: Electroluminescence imaging of crystalline silicon solar cells
Translate name
STANDARD published on 16.12.2021
Designation standards: IEC/TS 63202-2-ed.1.0
Publication date standards: 16.12.2021
SKU: NS-1045528
The number of pages: 19
Approximate weight : 57 g (0.13 lbs)
Country: International technical standard
Category: Technical standards IEC
IEC TS 63202-2:2021 specifies methods to detect and examine defects on bare crystalline silicon (c-Si) solar cells by means of electroluminescence (EL) imaging with the cell being placed in forward bias. It firstly provides guidelines for methods to capture electroluminescence images of non-encapsulated c-Si solar cells. In addition, it provides a list of defects which can be detected by EL imaging and provides information on the different possible methods to detect and differentiate such defects.
Latest update: 2026-07-06 (Number of items: 2 286 164)
© Copyright 2026 NORMSERVIS s.r.o.